Transient State Monitoring by Total Internal Reflection Fluorescence Microscopy

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Transient state monitoring by total internal reflection fluorescence microscopy.

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Topic Introduction Total Internal Reflection Fluorescence Microscopy

The goal in fluorescence microscopy is to detect the signal of fluorescently labeled molecules with great sensitivity and minimal background noise. In epifluorescence microscopy, it is difficult to observe weak signals along the optical axis, owing to the overpowering signal from the out-of-focus particles. Confocal microscopy uses a small pinhole to produce thin optical sections ( 500 nm), but...

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ژورنال

عنوان ژورنال: The Journal of Physical Chemistry B

سال: 2010

ISSN: 1520-6106,1520-5207

DOI: 10.1021/jp911034v